--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/gnv-artifacts/Changes	Fri Sep 28 12:13:47 2012 +0200
@@ -0,0 +1,75 @@
+2009-12-17  RELEASE 0.3
+
+    New:
+
+    * SVG export for charts (introducing Apache Batik dependency)
+    * PDF export for charts. (introducing iText dependency)
+    * style templating for charts via XML.
+    * Units are now localized and added to the charts
+    * Gap detection for horizontal and vertical profile charts.
+
+    * 'Horizontale Schnittprofile'
+
+    * Added region filters
+
+    Fixed:
+
+    * Various i18n messages. (Issue 129)
+    * problems with verticalprofile charts.
+    * TG_0030.008: "Unterscheidung bei Farben wechselt 
+      zwischen verschiedenen Ausgabeprodukten bei gleicher Parameterwahl"
+    * TG_0030.004: "Jahreszahlen an der Abszisse werden nicht angezeigt"
+    * TG_0030.004 : i18n funktioniert an Abzissenbeschriftung noch nicht (Issue 104)
+
+    Changed:
+
+    * The configuration system to define the workflows 
+      with artifacts. Cleaner separation states vs. transistions.
+
+    * Default configuration of ttl of artifacts is more realistic now.
+
+    * Used more recent versions of JFreeChart and Apache Common Math.
+
+    * Local caching of data is now used more consequently
+
+    Removed:
+
+    * Old conterra charting code.
+
+2009-11-13  RELEASE 0.2
+
+    * Adding support for relative pathnames relating to central 
+      config document (issue 59)
+
+    * Splitting of configuration documents (Issue 40)
+
+    * Corrected data model of artifacs (issue 3)
+
+    * Added FIS Sea State, SEACAT, Current Meter, Ice Station Reports 
+
+    * Implemented gaps for spatial and temportal gaps (issue 45)
+
+    * TG_0040.005: Added a first ODV support
+
+    * Added more input validation to make it more user-friendly
+
+    * Added a first documentation of configuration documents
+
+
+2009-10-07  RELEASE 0.1
+
+    * Initial release of the artifacts special for the
+      BSH Generic Viewer. They are to be configured to live
+      inside an artifact database via conf.xml.
+    
+    * The collection of parameters is modelled by transistions
+      inside the XML.
+    
+    * src/test/ressources/conf.xml gives a setup to use all
+      the provided artifacts.
+    
+    * Products can be produced for following FIS:
+      Marnet, IMIS, STAUN, Modeldata, Delphin, Thermosalinograph,
+      Chemusurvey, GTS, CTD, CBT in form of time series,
+      vertical profiles and horizontal profiles on meshes
+      and instantaneous points.