2009-12-17  RELEASE 0.3

    New:

    * SVG export for charts (introducing Apache Batik dependency)
    * PDF export for charts. (introducing iText dependency)
    * style templating for charts via XML.
    * Units are now localized and added to the charts
    * Gap detection for horizontal and vertical profile charts.

    * 'Horizontale Schnittprofile'

    * Added region filters

    Fixed:

    * Various i18n messages. (Issue 129)
    * problems with verticalprofile charts.
    * TG_0030.008: "Unterscheidung bei Farben wechselt 
      zwischen verschiedenen Ausgabeprodukten bei gleicher Parameterwahl"
    * TG_0030.004: "Jahreszahlen an der Abszisse werden nicht angezeigt"
    * TG_0030.004 : i18n funktioniert an Abzissenbeschriftung noch nicht (Issue 104)

    Changed:

    * The configuration system to define the workflows 
      with artifacts. Cleaner separation states vs. transistions.

    * Default configuration of ttl of artifacts is more realistic now.

    * Used more recent versions of JFreeChart and Apache Common Math.

    * Local caching of data is now used more consequently

    Removed:

    * Old conterra charting code.

2009-11-13  RELEASE 0.2

    * Adding support for relative pathnames relating to central 
      config document (issue 59)

    * Splitting of configuration documents (Issue 40)

    * Corrected data model of artifacs (issue 3)

    * Added FIS Sea State, SEACAT, Current Meter, Ice Station Reports 

    * Implemented gaps for spatial and temportal gaps (issue 45)

    * TG_0040.005: Added a first ODV support

    * Added more input validation to make it more user-friendly

    * Added a first documentation of configuration documents


2009-10-07  RELEASE 0.1

    * Initial release of the artifacts special for the
      BSH Generic Viewer. They are to be configured to live
      inside an artifact database via conf.xml.
    
    * The collection of parameters is modelled by transistions
      inside the XML.
    
    * src/test/ressources/conf.xml gives a setup to use all
      the provided artifacts.
    
    * Products can be produced for following FIS:
      Marnet, IMIS, STAUN, Modeldata, Delphin, Thermosalinograph,
      Chemusurvey, GTS, CTD, CBT in form of time series,
      vertical profiles and horizontal profiles on meshes
      and instantaneous points.