comparison gnv-artifacts/Changes @ 376:d8f3ef441bf2

merged gnv-artifacts/0.3
author Thomas Arendsen Hein <thomas@intevation.de>
date Fri, 28 Sep 2012 12:13:47 +0200
parents b3ad3cb94855
children f4e20322461b
comparison
equal deleted inserted replaced
293:6b0ef2324d02 376:d8f3ef441bf2
1 2009-12-17 RELEASE 0.3
2
3 New:
4
5 * SVG export for charts (introducing Apache Batik dependency)
6 * PDF export for charts. (introducing iText dependency)
7 * style templating for charts via XML.
8 * Units are now localized and added to the charts
9 * Gap detection for horizontal and vertical profile charts.
10
11 * 'Horizontale Schnittprofile'
12
13 * Added region filters
14
15 Fixed:
16
17 * Various i18n messages. (Issue 129)
18 * problems with verticalprofile charts.
19 * TG_0030.008: "Unterscheidung bei Farben wechselt
20 zwischen verschiedenen Ausgabeprodukten bei gleicher Parameterwahl"
21 * TG_0030.004: "Jahreszahlen an der Abszisse werden nicht angezeigt"
22 * TG_0030.004 : i18n funktioniert an Abzissenbeschriftung noch nicht (Issue 104)
23
24 Changed:
25
26 * The configuration system to define the workflows
27 with artifacts. Cleaner separation states vs. transistions.
28
29 * Default configuration of ttl of artifacts is more realistic now.
30
31 * Used more recent versions of JFreeChart and Apache Common Math.
32
33 * Local caching of data is now used more consequently
34
35 Removed:
36
37 * Old conterra charting code.
38
39 2009-11-13 RELEASE 0.2
40
41 * Adding support for relative pathnames relating to central
42 config document (issue 59)
43
44 * Splitting of configuration documents (Issue 40)
45
46 * Corrected data model of artifacs (issue 3)
47
48 * Added FIS Sea State, SEACAT, Current Meter, Ice Station Reports
49
50 * Implemented gaps for spatial and temportal gaps (issue 45)
51
52 * TG_0040.005: Added a first ODV support
53
54 * Added more input validation to make it more user-friendly
55
56 * Added a first documentation of configuration documents
57
58
59 2009-10-07 RELEASE 0.1
60
61 * Initial release of the artifacts special for the
62 BSH Generic Viewer. They are to be configured to live
63 inside an artifact database via conf.xml.
64
65 * The collection of parameters is modelled by transistions
66 inside the XML.
67
68 * src/test/ressources/conf.xml gives a setup to use all
69 the provided artifacts.
70
71 * Products can be produced for following FIS:
72 Marnet, IMIS, STAUN, Modeldata, Delphin, Thermosalinograph,
73 Chemusurvey, GTS, CTD, CBT in form of time series,
74 vertical profiles and horizontal profiles on meshes
75 and instantaneous points.

http://dive4elements.wald.intevation.org